| Age | Commit message (Collapse) | Author | |
|---|---|---|---|
| 2013-12-12 | ion: add test device for unit tests to interact with dma_bufs | Colin Cross | |
| Add a /dev/ion-test device that will be created if CONFIG_ION_TEST is set. The device accepts a dma_buf fd and allows reading and writing to the backing memory using DMA-like apis or kernel mapping apis. Can be used to test the dma_buf mapping ops, including the ion implementations, from userspace. Change-Id: I30703ba69cd75bdfe7767ac642e5f0cacd8d0478 Signed-off-by: Colin Cross <ccross@android.com> | |||
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index : linaro-lsk.git | |
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