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/** @file
*
* Copyright (c) 2013, ARM Limited. All rights reserved.
*
* This program and the accompanying materials
* are licensed and made available under the terms and conditions of the BSD License
* which accompanies this distribution. The full text of the license may be found at
* http://opensource.org/licenses/bsd-license.php
*
* THE PROGRAM IS DISTRIBUTED UNDER THE BSD LICENSE ON AN "AS IS" BASIS,
* WITHOUT WARRANTIES OR REPRESENTATIONS OF ANY KIND, EITHER EXPRESS OR IMPLIED.
*
**/
#ifndef __TFTF_H__
#define __TFTF_H__
#ifndef __ASSEMBLY__
#include <stddef.h>
#include <tests_api.h>
#include <tftf_common.h>
#define TFTF_WELCOME_STR "Booting trusted firmware test framework"
#define TESTS_MAGIC_VALUE 0xCAFED00D
/* Maximum size of test output (in bytes) */
#define TESTCASE_OUTPUT_MAX_SIZE 512
#define TEST_REPORT_FORMAT_RAW 0
#define TEST_REPORT_FORMAT_JUNIT 1
extern const char build_message[];
typedef TEST_RESULT (*TESTCASE_FUNC)(void);
typedef struct {
TFTF_TASK task;
TEST_RESULT result;
void* arguments;
} TASK_ENTRY;
typedef struct {
/// Test result (success, crashed, failed, ...).
TEST_RESULT result;
unsigned long long duration;
/**
** Offset of test output string from TEST_NVM_RESULT_BUFFER_OFFSET.
** Only relevant if test has an output, i.e. if \a output_size is not zero.
*/
unsigned output_offset;
/// Size of test output string, excluding final \0.
unsigned output_size;
} TESTCASE_RESULT;
typedef struct {
unsigned index;
const char* name;
const char* description;
TESTCASE_FUNC test;
} TESTCASE;
typedef struct {
const char* name;
const char* description;
const TESTCASE *testcases;
} TEST_SUITE;
/**
** @brief Write a string in the test output buffer.
**
** @note The test output buffer we are talking about here is a temporary buffer
** stored in RAM. This function doesn't write anything into NVM.
*/
void tftf_testcase_output(const char* string);
// The definition of this global variable is generated by the script 'tftf_generate_test_list'
// during the build process
extern const TEST_SUITE testsuites[];
extern TESTCASE_RESULT testcase_results[];
STATUS tftf_get_testcase_index(TESTCASE_FUNC testcase_function, unsigned *testsuite_index,
unsigned *testcase_index, unsigned get_next);
STATUS test_set_passed_and_next(TESTCASE_FUNC testcase_function);
STATUS tftf_testcase_set_result_as_crashed(TESTCASE_FUNC crashed_testcase_function);
void tftf_set_current_testcase(TESTCASE_FUNC testcase_function);
STATUS tftf_get_current_testcase(TESTCASE_FUNC* testcase_function);
void tftf_set_next_testcase(TESTCASE_FUNC testcase_function);
STATUS tftf_get_next_testcase(TESTCASE_FUNC* testcase_function);
/**
** Save test result into NVM.
*/
STATUS tftf_testcase_set_result(const TESTCASE* testcase, TEST_RESULT result, const char* output,
unsigned long long duration);
/**
** Get a testcase result from NVM.
**
** @param[in] testcase The targeted testcase.
** @param[out] result Testcase result. Only \a result.result and
** \a result.duration are of interest for the caller and the 2 other fields
** should be ignored (they correspond to a location in NVM).
** @param[out] test_output Buffer to store the test output, if any.
** \a test_output must be big enough to hold the whole test output.
** Test output will be \a TESTCASE_OUTPUT_MAX_SIZE bytes maximum.
*/
STATUS tftf_testcase_get_result(const TESTCASE* testcase, TESTCASE_RESULT *result, char *test_output);
STATUS tftf_testcase_update_result(const TESTCASE* testcase, TEST_RESULT result);
typedef unsigned TEST_REPORT_FORMAT;
void tftf_report_generate(void);
/*
* Exit the TFTF.
* This function can be used when a fatal error is encountered or as part of the
* normal termination process. It does the necessary cleanups then put the
* core in a low-power state.
*/
void __dead2 tftf_exit(void);
void tftf_arch_setup(void);
void tftf_register_gic_id(void);
uint8_t tftf_get_gic_cpu_id_from_mpidr(unsigned long mpidr);
uint8_t tftf_get_cpu_id_from_gic_id(uint8_t gic_id);
/* Print a debug message */
#if DEBUG
#define pr_debug(...) mp_printf(__VA_ARGS__)
#else
#define pr_debug(...) /* do nothing */
#endif /* DEBUG */
int tftf_systimer_setup(void);
/*
* Run the next test on the calling CPU.
* Once the test is complete, if the calling CPU is the last one to exit the
* test then do the necessary bookkeeping, report the overall test result and
* move on to the next test. Otherwise, shut down the calling CPU.
*
* This function never returns.
*/
void __dead2 run_tests(void);
/*
* Prevent the compiler from optimising the access to a variable.
* Note that this only affects the compiler, this is NOT a run-time
* memory barrier.
*/
#define ACCESS(var) (*(volatile __typeof__(var) *)&(var))
#endif /*__ASSEMBLY__*/
#endif
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