diff options
| -rw-r--r-- | tztest/el0/tztest_el0.c | 9 | ||||
| -rw-r--r-- | tztest/el1/tztest_el1.c | 9 |
2 files changed, 18 insertions, 0 deletions
diff --git a/tztest/el0/tztest_el0.c b/tztest/el0/tztest_el0.c index cbdab96..58d82a3 100644 --- a/tztest/el0/tztest_el0.c +++ b/tztest/el0/tztest_el0.c @@ -214,6 +214,14 @@ uint32_t el0_check_wfx_trap(uint32_t __attribute__((unused))arg) /* Get the current SCTLR so we can restore it later */ SVC_GET_REG(SCTLR, 1, sctlr); +#if 0 + /* Architecturally there is no guarantee that executing a WFE + * will cause it to trap -- the trap only happens if the WFE would + * put the CPU into a "power saving state", so a NOP implementation + * can validly not trap at all. Since QEMU's implementation of WFE + * does exactly this (though our WFI does not), disable the WFE tests. + */ + /* Clear SCTLR.nTWE to cause WFE instructions to trap to EL1 */ SVC_SET_REG(SCTLR, 1, sctlr & ~SCTLR_nTWE); TEST_MSG("WFE (SCTLR.nTWE clear, SCR.WFE clear)"); @@ -230,6 +238,7 @@ uint32_t el0_check_wfx_trap(uint32_t __attribute__((unused))arg) SVC_SET_REG(SCTLR, 1, sctlr | SCTLR_nTWE); TEST_MSG("WFE (SCTLR.nTWE set, SCR.WFE set)"); TEST_EL3_EXCEPTION(asm volatile("wfe\n"), EC_WFI_WFE); +#endif /* Restore SCR */ SVC_SET_REG(SCR, 3, scr); diff --git a/tztest/el1/tztest_el1.c b/tztest/el1/tztest_el1.c index 13372fa..6bcecba 100644 --- a/tztest/el1/tztest_el1.c +++ b/tztest/el1/tztest_el1.c @@ -96,6 +96,14 @@ uint32_t el1_check_wfx_trap(uint32_t __attribute__((unused))arg) TEST_MSG("WFE (SCTLR.nTWE clear, SCR.WFE clear)"); TEST_NO_EXCEPTION(asm volatile("wfe\n")); +#if 0 + /* Architecturally there is no guarantee that executing a WFE + * will cause it to trap -- the trap only happens if the WFE would + * put the CPU into a "power saving state", so a NOP implementation + * can validly not trap at all. Since QEMU's implementation of WFE + * does exactly this (though our WFI does not), disable the WFE tests. + */ + /* Trap WFE instructions to EL3. This should work regardless of the * SCTLR.nTWE setting. */ @@ -107,6 +115,7 @@ uint32_t el1_check_wfx_trap(uint32_t __attribute__((unused))arg) WRITE_SCTLR(sctlr | SCTLR_nTWE); TEST_MSG("WFE (SCTLR.nTWE set, SCR.WFE set)"); TEST_EL3_EXCEPTION(asm volatile("wfe\n"), EC_WFI_WFE); +#endif /* We cannot test the effect of WFI in EL1 mode like we did with WFE as it * causes a hang. It is assumed that since the exception is not trapped we |